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   FAILURE ANALYSIS / NANO PROBE / ADVANCED "DIMPLE GRINDER" / DESKTOP PLASMA / LASER CUTTER/THERMAL >REFERENCE WAFER > REFERENCE WAFER (RW10)
 
 
 
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MODEL RW10 REFERENCE WAFER

The Reference Wafer combines capacitors, resistors, MOS devices, 
and junction device in a wafer-like configuration.
The RW10 enables the rapid verification of operation for capacitance-
voltage and current-voltage instrumentation.
This convenient reference wafer can be placed on a Hot Chuck System
or Prober and measured in place of a regular wafer.
It can easily help check the integrity of the entire measurement system
including all cables, multiplexers, and Probe System Components.
The RW10 can quickly isolate problems caused by bad probes, defective
cables, improper grounding, or faulty meters.

A calibration certificate accompanies the RW10 Reference Wafer.
The certificate includes all capacitance and resistance values and
capacitance-voltage plots of MOS junction devices.

This 100 mm (4 inch) diameter RW10 device includes contact pads
for the following components:

  ¡à Open Circuit
  ¡à Short Circuit
 
 ¡à 10 pF Capacitor
 
 ¡à 100 pF Capacitor

  ¡à 1,000 pF Capacitor
  ¡à 1,000 pF Capacitor + 160 Ohm Resistor
  ¡à 1 Megohm Resistor
  ¡à PN Junction
  ¡à n-MOS Capacitor
  ¡à p-MOS Capacitor

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